Murata Electronics GCM155R71H104KE02D


- Part Number:
GCM155R71H104KE02D
- Manufacturer:
- Category:
- RoHs:
RoHS Compliant
- Datasheet:
GCM155R71H104KE02D_Datesheet
- Description:
0.1 µF ±10% 50V Ceramic Capacitor X7R 0402 (1005 Metric)
- In stock 1,723,957
Min: 1Mult: 1
Unit Price: $Subtotal: $
Product Specification Summary for GCM155R71H104KE02D
Basic Information
- Supplier: Murata Manufacturing Co., Ltd.
- Murata Part Number: GCM155R71H104KE02D
- Product: Chip Multilayer Ceramic Capacitor
- Description: 0402, X7R:EIA, 0.1µF, DC50V
Part Number Breakdown
- (1) Chip Multilayer Ceramic Capacitor
- (2) Structure (W : Winding Type)
- (3) Dimension (L×W)
- (4) Type
- (5) Category
- (6) Impedance (Typ. at 100MHz)
- (7) Circuit
- (8) Features
- (9) Number of Line
- (10) Packaging Code
Type & Dimensions
- Length (L): 1.0 ± 0.05 mm
- Width (W): 0.5 ± 0.05 mm
- Height (H): 0.3 mm (min.)
Rated Value
- Rated Voltage: DC 50V
- Nominal Capacitance: 0.1 µF
- Capacitance Tolerance: ±10%
- Temperature Range: -55 to 125°C
- Temperature Characteristics: X7R (EIA)
Packaging
- Packaging Unit:f330mm Reel, PAPER W8P2, 50000 pcs./Reelf180mm Reel, PAPER W8P2, 10000 pcs./Reelf180mm Reel, PAPER W8P1, 20000 pcs./Reel
Pre-and Post-Stress Electrical Test
High Temperature Exposure (Storage)
- Specification: Meet the specifications in the following table.
- Test Conditions: Solder the capacitor on the test substrate (glass epoxy board). Set the capacitor for 1000 ± 12h at 150 ± 3℃.
- Appearance: No marking defects.
- Capacitance Change: Within ±10%.
- D.F. (Dissipation Factor): 0.2 max.
- Insulation Resistance: Within the specified initial value.
- Initial Measurement: Perform a heat treatment at 150 ± 10℃ for 1h and then sit for 24 ± 2h at room temperature.
Temperature Cycling
- Specification: Meet the specifications in the following table.
- Test Conditions: Perform the 1000 cycles test according to the four heat treatments listed in the table.
- Appearance: No marking defects.
- Capacitance Change: Within ±7.5%.
- D.F. (Dissipation Factor): 0.2 max.
- Insulation Resistance: Within the specified initial value.
- Initial Measurement: Perform a heat treatment at 150 ± 10℃ for 1h and then sit for 24 ± 2h at room temperature.
Destructive Physical Analysis
- Specification: No defects or abnormalities.
- Test Method: Per EIA-469.
Moisture Resistance
- Specification: Meet the specifications in the following table.
- Test Conditions: Apply the 24h heat (25℃ to 65℃) and humidity (80%RH to 98%RH) treatment shown below, 10 consecutive times.
- Appearance: No marking defects.
- Capacitance Change: Within ±10%.
- D.F. (Dissipation Factor): 0.2 max.
- Insulation Resistance: Within the specified initial value.
- Initial Measurement: Perform a heat treatment at 150 ± 10℃ for 1h and then sit for 24 ± 2h at room temperature.
Biased Humidity
- Specification: Meet the specifications in the following table.
- Test Conditions: Apply the rated voltage and 1.3 ± 0.2Vdc (add 6.8kΩ resistor) at 85 ± 3℃ and 80%RH to 85%RH humidity for 1000 ± 12h. The charge/discharge current is less than 50mA.
- Appearance: No marking defects.
- Capacitance Change: Within ±10%.
- D.F. (Dissipation Factor): 0.2 max.
- Insulation Resistance: More than 200MΩ or 5Ω・F (whichever is smaller).
- Initial Measurement: Perform a heat treatment at 150 ± 10℃ for 1h and then sit for 24 ± 2h at room temperature.
AEC-Q200 Murata Standard Specification and Test Methods
Operational Life
- Specification: Meet the specifications in the following table.
- Test Conditions: Apply 150% of the rated voltage for 1000 ± 12h at 125 ± 3℃. The charge/discharge current is less than 50mA.
- Appearance: No marking defects.
- Capacitance Change: Within ±12.5%.
- D.F. (Dissipation Factor): 0.2 max.
- Insulation Resistance: More than 200MΩ or 5Ω・F (whichever is smaller).
- Initial Measurement: Perform a heat treatment at 150 ± 10℃ for 1h and then sit for 24 ± 2h at room temperature.
External Visual
- Specification: No defects or abnormalities.
- Test Method: Visual inspection.
Physical Dimension
- Specification: Within the specified dimensions.
- Test Method: Using Measuring instrument of dimension.
Resistance to Solvents
- Specification: Meet the specifications in the following table.
- Test Conditions:Solvent 1: 1 part (by volume) of isopropyl alcohol, 3 parts (by volume) of mineral spirits.Solvent 2: Terpene defluxer.Solvent 3: 42 parts (by volume) of water, 1 part (by volume) of propylene glycol monomethyl ether, 1 part (by volume) of monoethanolamine.
- Appearance: No marking defects.
- Capacitance: Within the specified initial value.
- D.F. (Dissipation Factor): Within the specified initial value.
- Insulation Resistance: Within the specified initial value.
Mechanical Shock
- Specification: No defects or abnormalities.
- Test Conditions: Solder the capacitor on the test substrate (glass epoxy board). Three shocks in each direction should be applied along 3 mutually perpendicular axes of the test specimen (18 shocks). The specified test pulse should be Half-sine and should have a duration: 0.5ms, peak value: 1500g and velocity change: 4.7m/s.
- Capacitance: Within the specified initial value.
- D.F. (Dissipation Factor): Within the specified initial value.
- Insulation Resistance: Within the specified initial value.
Vibration
- Specification: No defects or abnormalities.
- Test Conditions: Solder the capacitor on the test substrate (glass epoxy board). The capacitor should be subjected to a simple harmonic motion having a total amplitude of 1.5mm, the frequency being varied uniformly between the approximate limits of 10 and 2000Hz. The frequency range, from 10 to 2000Hz and return to 10Hz, should be traversed in approximately 20 minutes. This motion should be applied for 12 items in each 3 mutually perpendicular directions (total of 36 times).
- Capacitance: Within the specified initial value.
- D.F. (Dissipation Factor): Within the specified initial value.
- Insulation Resistance: Within the specified initial value.
Resistance to Soldering Heat
- Specification: Meet the specifications in the following table.
- Test Conditions: Immerse the capacitor in Sn-3.0Ag-0.5Cu solder solution or an eutectic solder solution at 260 ± 5℃ for 10 ± 1s. Set at room temperature for 24 ± 2h, then measure.
- Appearance: No marking defects.
- Capacitance: Within the specified initial value.
- D.F. (Dissipation Factor): Within the specified initial value.
- Insulation Resistance: Within the specified initial value.
Thermal Shock
- Specification: Meet the specifications in the following table.
- Test Conditions: Perform the 300 cycles according to the two heat treatments listed in the table (Maximum transfer time is
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Murata Electronics

Murata Electronics

Murata Electronics

Murata Electronics

Murata Electronics

Murata Electronics

Murata Electronics

Murata Electronics

Murata Electronics

Murata Electronics

Murata Electronics

Murata Electronics