DESCRIPTION

· The SN54BCT8244A and SN74BCT8244A are scan test devices with octal buffers, part of Texas Instruments' SCOPE™ testability IC family.

· These devices support IEEE Standard 1149.1-1990 boundary scan for testing complex circuit-board assemblies.

· In normal mode, they function equivalently to the 'F244 and 'BCT244 octal buffers.

· Test circuitry is accessed via a 4-wire Test Access Port (TAP) interface.

FEATURES

· Compatible with IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture.

· Test operation is synchronous to the TAP.

· Implements optional test reset signal via a double-high-level voltage (10 V) on the TMS pin.

· Includes SCOPE™ instruction set with required IEEE Standard 1149.1-1990 instructions and optional INTEST, CLAMP, and HIGHZ.

· Supports parallel-signature analysis at inputs and pseudo-random pattern generation from outputs.

· Available in various package options including plastic small-outline, ceramic chip carriers, and standard plastic/ceramic 300-mil DIPs.

APPLICATIONS

· Facilitates testing of complex circuit-board assemblies through boundary-scan capabilities.

· Used in scenarios requiring snapshot sampling of data at device terminals.

· Suitable for self-test operations on boundary-test cells without affecting normal functional operation.

· Ideal for applications needing observation and control of I/O boundaries in test mode.