EPC FBS-GAM02P-R-PSE


- Part Number:
FBS-GAM02P-R-PSE
- Manufacturer:
- Category:
- RoHs:
Non-RoHS Compliant - Datasheet:
- Description:
GAN DUAL HI/LO SIDE DRIVER 18SMT
- In stock 41
FBS-GAM02P-R-PSE Datasheet Comprehensive Summary
1. Overview
The FBS-GAM02P-R-PSE is a radiation-hardened, high-speed multifunction power gate driver module from EPC Space, designed based on the patented "GaN-Driving-GaN Technology". It integrates two independent high-speed gate drive circuits (composed entirely of eGaN® switching elements), a high-side driver bootstrap diode, input shoot-through prevention logic for half-bridge configurations, and +5 VDC gate drive bias power good monitoring circuitry. Packaged in an 18-pin SMT molded epoxy package with "pillar" I/O pads, this module is engineered to drive external EPC Space eGaN® HEMT power switches rated up to 100 VDC, with post-radiation effect guarantees and compliance with commercial 9A515.x device standards.
2. Key Features
2.1 Electrical & Functional Capabilities
- Voltage Operation: 50 VDC fully de-rated operation (100 VDC capable) with an internal 100 V-rated bootstrap diode.
- Gate Driver Configuration: Four flexible operating modes:
- Performance: High-speed switching capability (up to 3.0 MHz for low-side, 2.0 MHz for high-side), with dynamic gate/driver losses as low as 25 mW/MHz (per driver).
- Protection & Monitoring: Internal power good (PG) circuitry, under-voltage lockout (UVLO), over-voltage lockout (OVLO), and high/low-true shutdown inputs (*SD/SD).
2.2 Environmental & Mechanical Specifications
- Temperature Range: -55 °C to +110 °C (operating case temperature); -55 °C to +140 °C (storage junction temperature).
- Radiation Hardness:
- Package: Compact 18-pin SMT molded epoxy package with pillar I/O pads; dimensions: 1.00 × 0.75 × 0.125 inches.
- ESD Protection: Class 1A (Human Body Model).
3. Pin Configuration & Function
The module features 18 pins with dedicated functions for logic control, power supply, gate driving, and protection. Key pin details are summarized below:
| Pin # | Pin Name | I/O Type | Core Function | Key Notes |
|---|---|---|---|---|
| 1 | BIN | Input | Low-side switch logic input | Logic low (“0”) → BGATE low; logic high (“1”) → BGATE high |
| 2 | TIN | Input | High-side switch logic input | Logic low (“0”) → TGATE low; logic high (“1”) → TGATE high |
| 3 | LGND | -- | Logic ground | Must connect to system logic ground (low current) |
| 4 | VBIAS | Input | +5 VDC gate driver power supply | Recommend bypassing with 1.0 μF + 0.1 μF 25 V ceramic capacitors |
| 5 | PG | Output | Power good (open-drain) | Pull-up to VBIAS (4.7 kΩ resistor); low if VBIAS is outside UVLO/OVLO range |
| 6 | *SD | Input | Low-true shutdown | Pull to LGND to disable both gate drivers; leave open if unused |
| 7 | SD | Input | High-true shutdown | Pull to VBIAS to disable both gate drivers; leave open if unused |
| 8 | TOS | -- | Switching node sense | Internally connected to SN (Pin 12); return for bootstrap capacitor |
| 9 | N/C | -- | No internal connection | Recommended to tie to PGND (0 Ω jumper) for noise immunity |
| 10 | TBST | -- | High-side bootstrap supply | “+” connection for bootstrap capacitor; minimize trace length (high dV/dt) |
| 11 | TGATE | Output | High-side gate output | Connect to external high-side eGaN® HEMT gate; high dV/dt/dI/dt signal |
| 12 | SN | -- | High-side switching node | Connect to source sense (SS) of external high-side HEMT |
| 13 | BGATE | Output | Low-side gate output | Connect to external low-side eGaN® HEMT gate; high dV/dt/dI/dt signal |
| 14 | PGND | -- | Power ground | Connect to external low-side HEMT source; low-impedance path required |
| 15 | BCON | Input | Low-side shoot-through control | Tie to BSTP (Pin 16) for shoot-through protection; open if unused |
| 16 | BSTP | Output | Low-side shoot-through protection | Logical inverse of TIN; tie to BCON (Pin 15) for protection |
| 17 | TSTP | Output | High-side shoot-through protection | Logical inverse of BIN; tie to TCON (Pin 18) for protection |
| 18 | TCON | Input | High-side shoot-through control | Tie to TSTP (Pin 17) for shoot-through protection; open if unused |
4. Electrical Specifications
4.1 Absolute Maximum Ratings (TC = 25 °C)
| Parameter | Value | Unit |
|---|---|---|
| SN to PGND Voltage | 50 | V |
| BGATE/TGATE Output Capacitance | 10,000 | pF |
| VBIAS Voltage Range | -0.3 to 6.5 | V |
| BIN/TIN Input Voltage Range | -0.3 to 5.0 | V |
| Junction Operating Temperature (TJ) | -55 to +130 | °C |
| Case Operating Temperature (TC) | -55 to +110 | °C |
| ESD (HBM) | Class 1A | -- |
4.2 Typical Electrical Characteristics (TC = 25 °C, VBIAS = 5 VDC)
Gate Driver Output (BGATE/TGATE)
| Parameter | Symbol | Test Conditions | Min | Typ | Max | Unit |
|---|---|---|---|---|---|---|
| BGATE Low-Level Voltage | VOL | IB GATE = 50 μA | -- | 0.05 | 0.10 | VDC |
| BGATE High-Level Voltage | VOH | IB GATE = -50 μA | 4.90 | 4.95 | -- | VDC |
| BGATE Pull-Down ON-Resistance | RDS(on) | IB GATE = 0.25 A | -- | 2.5 | 3.5 | Ω |
| TGATE High-Level Voltage | VOH | IT GATE = -50 μA, SN = 0 V | 4.45 | 4.55 | -- | VDC |
| TGATE Pull-Up ON-Resistance | RDS(on) | IT GATE = -0.25 A | -- | 2.5 | 3.5 | Ω |
Switching Performance
| Parameter | Symbol | Test Conditions | Typ | Max | Unit |
|---|---|---|---|---|---|
| BIN-to-BGATE Turn-On Delay | td(on) | COUT = 2200 pF | -- | 30 | ns |
| TIN-to-TGATE Turn-On Delay | td(on) | COUT = 2200 pF | -- | 65 | ns |
| BGATE Rise Time (tr) | tr | COUT = 2200 pF | 42 | 45 | ns |
| TGATE Fall Time (tf) | tf | COUT = 2200 pF | 38 | 45 | ns |
Power Good (PG) & UVLO/OVLO
| Parameter | Symbol | Test Conditions | Min | Typ | Max | Unit |
|---|---|---|---|---|---|---|
| VBIAS UVLO Rising Threshold | UVLO+ | -- | -- | -- | 4.45 | V |
| VBIAS UVLO Falling Threshold | UVLO- | -- | 2.95 | -- | -- | V |
| VBIAS OVLO Rising Threshold | OVLO+ | -- | -- | -- | 6.70 | V |
| PG Low-Level Voltage | VOL | Pull-up = 4.7 kΩ | -- | -- | 0.2 | V |
5. Recommended External Components
5.1 eGaN® HEMT Power Transistors
The module is optimized to drive EPC Space eGaN® HEMTs. Recommended models for different voltage/current requirements are:
| VDD (VDC) | IO (ADC) | EPC Space P/N | RDS(on) (mΩ) | Package |
|---|---|---|---|---|
| 40 | 8 | FBG04N08AX | 24 | FSMD-A |
| 40 | 30 | FBG04N30BX | 6 | FSMD-B |
| 100 | 5 | FBG10N05AX | 38 | FSMD-A |
| 100 | 30 | FBG10N30BX | 9 | FSMD-B |
5.2 Bypass & Bootstrap Components
- VBIAS Bypass: 1.0 μF + 0.1 μF 25 V ceramic capacitors (between VBIAS (Pin 4) and PGND (Pin 14)).
- Bootstrap Capacitor: 1 μF external capacitor (between TBST (Pin 10) and TOS (Pin 8)) + internal 47 nF capacitor.
6. Typical Applications
The FBS-GAM02P-R-PSE is suitable for high-reliability, high-speed power conversion and motor control systems, including:
- High-Speed DC-DC Conversion: POL (Point of Load) converters, high-current DC-DC converters.
- Motor Drives: Single/multi-phase motor phase drivers (e.g., aerospace actuation systems).
- Power Switches: High-voltage power switches/actuators in avionics.
- Space Electronics: Commercial satellite EPS (Electrical Power Systems) and avionics power modules.
6.1 Key Application Circuits
- Single High-Side Configuration: Drives a high-side eGaN® HEMT (Qext) with PWM input to TIN (Pin 2); SN (Pin 12) connects to Qext source.
- Half-Bridge Configuration: Integrates low-side (Qext1) and high-side (Qext2) HEMTs with shoot-through protection (BCON-BSTP and TCON-TSTP tied); outputs regulated voltage (VOUT = VDD × (ton/T)).
7. PCB Design Guidelines
7.1 Solder Pad Configuration
- Follow the recommended PCB solder pad dimensions (see Figure 19 in the original datasheet) for optimal thermal/electrical performance.
- Use Sn63/Pb37 no-clean solder paste; maximum peak reflow temperature: 230 °C (dwell time < 4.5 minutes).
7.2 Layout Best Practices
- High-Speed Signals: Minimize trace lengths for TGATE (Pin 11), BGATE (Pin 13), and SN (Pin 12) to reduce EMI and voltage ringing.
- Grounding: Separate LGND (logic ground) and PGND (power ground); connect PGND to a low-impedance power ground plane.
- Bypassing: Place VBIAS bypass capacitors as close to Pin 4 (VBIAS) and Pin 14 (PGND) as possible.
8. Ordering Information & Part Number Decoding
The part number FBS-GAM02P-R-PSE follows EPC Space’s naming convention:
- FBS: Product family (GaN adaptor module).
- GAM02P: Model identifier (multifunction gate driver, molded plastic package).
- R: Radiation-hardened grade.
- PSE: Power switch external driver (application type).
- No additional suffixes are required for tape-and-reel packaging; standard shipping is in tape-and-reel format.
9. Radiation & Reliability
- Total Ionizing Dose (TID): Guaranteed to survive 100 kRad (Si) under high dose rate, with parametric stability pre/post-radiation.
- Single Event Effects (SEE): Immune to heavy ions (Au, LET = 83.7 MeV·cm²/mg) to prevent latch-up or burnout.
- Quality Assurance: 100% wafer-by-wafer radiation-hardness validation for eGaN® elements; compliant with Mil-Std-750 Method 1019.
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