EPC FBS-GAM02P-R-PSE

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  • Part Number:

    FBS-GAM02P-R-PSE

  • Manufacturer:

    EPC

  • Category:

    Display Drivers

  • RoHs:

    rohs Non-RoHS Compliant

  • Datasheet:

  • Description:

    GAN DUAL HI/LO SIDE DRIVER 18SMT

  • In stock 41
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Specifications
Type
Paramete
Type
Paramete
Rise / Fall Time (Typ)
35ns, 22ns
Gate Type
N-Channel MOSFET
Logic Voltage - VIL, VIH
0.8V, 2.9V
Package / Case
18-SMD Module
Input Type
Non-Inverting
Channel Type
Independent
Driven Configuration
High-Side and Low-Side
High Side Voltage - Max (Bootstrap)
100 V
Supplier Device Package
-
Grade
-
Qualification
-
Mounting Type
Surface Mount
Voltage - Supply
4.5V ~ 5.5V, 5V ~ 50V
Current - Peak Output (Source, Sink)
-
Number of Drivers
2
Operating Temperature
-55°C ~ 130°C (TJ)
Overview

FBS-GAM02P-R-PSE Datasheet Comprehensive Summary


1. Overview

The FBS-GAM02P-R-PSE is a radiation-hardened, high-speed multifunction power gate driver module from EPC Space, designed based on the patented "GaN-Driving-GaN Technology". It integrates two independent high-speed gate drive circuits (composed entirely of eGaN® switching elements), a high-side driver bootstrap diode, input shoot-through prevention logic for half-bridge configurations, and +5 VDC gate drive bias power good monitoring circuitry. Packaged in an 18-pin SMT molded epoxy package with "pillar" I/O pads, this module is engineered to drive external EPC Space eGaN® HEMT power switches rated up to 100 VDC, with post-radiation effect guarantees and compliance with commercial 9A515.x device standards.


2. Key Features


2.1 Electrical & Functional Capabilities


  • Voltage Operation: 50 VDC fully de-rated operation (100 VDC capable) with an internal 100 V-rated bootstrap diode.
  • Gate Driver Configuration: Four flexible operating modes:
  • Performance: High-speed switching capability (up to 3.0 MHz for low-side, 2.0 MHz for high-side), with dynamic gate/driver losses as low as 25 mW/MHz (per driver).
  • Protection & Monitoring: Internal power good (PG) circuitry, under-voltage lockout (UVLO), over-voltage lockout (OVLO), and high/low-true shutdown inputs (*SD/SD).

2.2 Environmental & Mechanical Specifications


  • Temperature Range: -55 °C to +110 °C (operating case temperature); -55 °C to +140 °C (storage junction temperature).
  • Radiation Hardness:
  • Package: Compact 18-pin SMT molded epoxy package with pillar I/O pads; dimensions: 1.00 × 0.75 × 0.125 inches.
  • ESD Protection: Class 1A (Human Body Model).

3. Pin Configuration & Function

The module features 18 pins with dedicated functions for logic control, power supply, gate driving, and protection. Key pin details are summarized below:


Pin #Pin NameI/O TypeCore FunctionKey Notes
1BINInputLow-side switch logic inputLogic low (“0”) → BGATE low; logic high (“1”) → BGATE high
2TINInputHigh-side switch logic inputLogic low (“0”) → TGATE low; logic high (“1”) → TGATE high
3LGND--Logic groundMust connect to system logic ground (low current)
4VBIASInput+5 VDC gate driver power supplyRecommend bypassing with 1.0 μF + 0.1 μF 25 V ceramic capacitors
5PGOutputPower good (open-drain)Pull-up to VBIAS (4.7 kΩ resistor); low if VBIAS is outside UVLO/OVLO range
6*SDInputLow-true shutdownPull to LGND to disable both gate drivers; leave open if unused
7SDInputHigh-true shutdownPull to VBIAS to disable both gate drivers; leave open if unused
8TOS--Switching node senseInternally connected to SN (Pin 12); return for bootstrap capacitor
9N/C--No internal connectionRecommended to tie to PGND (0 Ω jumper) for noise immunity
10TBST--High-side bootstrap supply“+” connection for bootstrap capacitor; minimize trace length (high dV/dt)
11TGATEOutputHigh-side gate outputConnect to external high-side eGaN® HEMT gate; high dV/dt/dI/dt signal
12SN--High-side switching nodeConnect to source sense (SS) of external high-side HEMT
13BGATEOutputLow-side gate outputConnect to external low-side eGaN® HEMT gate; high dV/dt/dI/dt signal
14PGND--Power groundConnect to external low-side HEMT source; low-impedance path required
15BCONInputLow-side shoot-through controlTie to BSTP (Pin 16) for shoot-through protection; open if unused
16BSTPOutputLow-side shoot-through protectionLogical inverse of TIN; tie to BCON (Pin 15) for protection
17TSTPOutputHigh-side shoot-through protectionLogical inverse of BIN; tie to TCON (Pin 18) for protection
18TCONInputHigh-side shoot-through controlTie to TSTP (Pin 17) for shoot-through protection; open if unused

4. Electrical Specifications


4.1 Absolute Maximum Ratings (TC = 25 °C)


ParameterValueUnit
SN to PGND Voltage50V
BGATE/TGATE Output Capacitance10,000pF
VBIAS Voltage Range-0.3 to 6.5V
BIN/TIN Input Voltage Range-0.3 to 5.0V
Junction Operating Temperature (TJ)-55 to +130°C
Case Operating Temperature (TC)-55 to +110°C
ESD (HBM)Class 1A--

4.2 Typical Electrical Characteristics (TC = 25 °C, VBIAS = 5 VDC)


Gate Driver Output (BGATE/TGATE)


ParameterSymbolTest ConditionsMinTypMaxUnit
BGATE Low-Level VoltageVOLIB GATE = 50 μA--0.050.10VDC
BGATE High-Level VoltageVOHIB GATE = -50 μA4.904.95--VDC
BGATE Pull-Down ON-ResistanceRDS(on)IB GATE = 0.25 A--2.53.5Ω
TGATE High-Level VoltageVOHIT GATE = -50 μA, SN = 0 V4.454.55--VDC
TGATE Pull-Up ON-ResistanceRDS(on)IT GATE = -0.25 A--2.53.5Ω

Switching Performance


ParameterSymbolTest ConditionsTypMaxUnit
BIN-to-BGATE Turn-On Delaytd(on)COUT = 2200 pF--30ns
TIN-to-TGATE Turn-On Delaytd(on)COUT = 2200 pF--65ns
BGATE Rise Time (tr)trCOUT = 2200 pF4245ns
TGATE Fall Time (tf)tfCOUT = 2200 pF3845ns

Power Good (PG) & UVLO/OVLO


ParameterSymbolTest ConditionsMinTypMaxUnit
VBIAS UVLO Rising ThresholdUVLO+------4.45V
VBIAS UVLO Falling ThresholdUVLO---2.95----V
VBIAS OVLO Rising ThresholdOVLO+------6.70V
PG Low-Level VoltageVOLPull-up = 4.7 kΩ----0.2V

5. Recommended External Components


5.1 eGaN® HEMT Power Transistors

The module is optimized to drive EPC Space eGaN® HEMTs. Recommended models for different voltage/current requirements are:


VDD (VDC)IO (ADC)EPC Space P/NRDS(on) (mΩ)Package
408FBG04N08AX24FSMD-A
4030FBG04N30BX6FSMD-B
1005FBG10N05AX38FSMD-A
10030FBG10N30BX9FSMD-B

5.2 Bypass & Bootstrap Components


  • VBIAS Bypass: 1.0 μF + 0.1 μF 25 V ceramic capacitors (between VBIAS (Pin 4) and PGND (Pin 14)).
  • Bootstrap Capacitor: 1 μF external capacitor (between TBST (Pin 10) and TOS (Pin 8)) + internal 47 nF capacitor.

6. Typical Applications

The FBS-GAM02P-R-PSE is suitable for high-reliability, high-speed power conversion and motor control systems, including:


  1. High-Speed DC-DC Conversion: POL (Point of Load) converters, high-current DC-DC converters.
  2. Motor Drives: Single/multi-phase motor phase drivers (e.g., aerospace actuation systems).
  3. Power Switches: High-voltage power switches/actuators in avionics.
  4. Space Electronics: Commercial satellite EPS (Electrical Power Systems) and avionics power modules.

6.1 Key Application Circuits


  • Single High-Side Configuration: Drives a high-side eGaN® HEMT (Qext) with PWM input to TIN (Pin 2); SN (Pin 12) connects to Qext source.
  • Half-Bridge Configuration: Integrates low-side (Qext1) and high-side (Qext2) HEMTs with shoot-through protection (BCON-BSTP and TCON-TSTP tied); outputs regulated voltage (VOUT = VDD × (ton/T)).

7. PCB Design Guidelines


7.1 Solder Pad Configuration


  • Follow the recommended PCB solder pad dimensions (see Figure 19 in the original datasheet) for optimal thermal/electrical performance.
  • Use Sn63/Pb37 no-clean solder paste; maximum peak reflow temperature: 230 °C (dwell time < 4.5 minutes).

7.2 Layout Best Practices


  • High-Speed Signals: Minimize trace lengths for TGATE (Pin 11), BGATE (Pin 13), and SN (Pin 12) to reduce EMI and voltage ringing.
  • Grounding: Separate LGND (logic ground) and PGND (power ground); connect PGND to a low-impedance power ground plane.
  • Bypassing: Place VBIAS bypass capacitors as close to Pin 4 (VBIAS) and Pin 14 (PGND) as possible.

8. Ordering Information & Part Number Decoding

The part number FBS-GAM02P-R-PSE follows EPC Space’s naming convention:


  • FBS: Product family (GaN adaptor module).
  • GAM02P: Model identifier (multifunction gate driver, molded plastic package).
  • R: Radiation-hardened grade.
  • PSE: Power switch external driver (application type).
  • No additional suffixes are required for tape-and-reel packaging; standard shipping is in tape-and-reel format.

9. Radiation & Reliability


  • Total Ionizing Dose (TID): Guaranteed to survive 100 kRad (Si) under high dose rate, with parametric stability pre/post-radiation.
  • Single Event Effects (SEE): Immune to heavy ions (Au, LET = 83.7 MeV·cm²/mg) to prevent latch-up or burnout.
  • Quality Assurance: 100% wafer-by-wafer radiation-hardness validation for eGaN® elements; compliant with Mil-Std-750 Method 1019.


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